Memory testing 2--------Catogories

 

参考：

https://booksite.elsevier.com/9780123705976/errata/13~Chapter%2008%20MBIST.pdf

http://www.ee.ncu.edu.tw/~jfli/memtest/lecture/ch02.pdf

https://link.springer.com/content/pdf/bbm%3A978-0-306-47972-4%2F1.pdf

 

 

1、AC parametric tests

* Measure static analog characteristics of the device’s input/output interface

* E.g., measure the leakage current, static and dynamic power supply current, output voltage, dynamic power supply current, output voltage level, and so on

 

2、DC parametric tests

∗ Measure dynamic parameters of the device’s input/output interface

∗ E.g., measure setup time, hold time, rise time, fall, time, etc. time, etc.

 

3、Reliability Tests

• Long-cycle testing
• Burn-in: static & dynamic BurnIn Test

 

4、Functional Tests

• Device characterization:Failure analysis;
• Fault modeling:Simple but effective (accurate & realistic)
• Test algorithm generation:Short test time, High fault coverage, Small number of test patterns (data backgrounds)

 

5、Dynamic Tests

∗ Detect timing faults affecting internal device- under- test circuitry

∗ E.g. detect slow sense amplifier operation, slow address decoder operation, etc.